ASTM International - ASTM E2444-11
Terminology Relating to Measurements Taken on Thin, Reflecting Films
Organization: | ASTM International |
Publication Date: | 15 October 2011 |
Status: | inactive |
Page Count: | 2 |
ICS Code (Electronics (Vocabularies)): | 01.040.31 |
ICS Code (Mechanical structures for electronic equipment): | 31.240 |
scope:
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanic
1.2 The terms are listed in alphabetical order.