ASTM International - ASTM E2444-11e1
Terminology Relating to Measurements Taken on Thin, Reflecting Films
inactive
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| Organization: | ASTM International |
| Publication Date: | 15 October 2011 |
| Status: | inactive |
| Page Count: | 2 |
| ICS Code (Electronics (Vocabularies)): | 01.040.31 |
| ICS Code (Mechanical structures for electronic equipment): | 31.240 |
scope:
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanic
1.2 The terms are listed in alphabetical order.
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