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ASTM International - ASTM E1832-08(2012)

Standard Practice for Describing and Specifying a Direct Current Plasma Atomic Emission Spectrometer

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Organization: ASTM International
Publication Date: 1 December 2012
Status: inactive
Page Count: 6
ICS Code (Optical measuring instruments): 17.180.30
significance And Use:

4.1 This practice describes the essential components of the DCP spectrometer. This description allows the user or potential user to gain a basic understanding of this system. It also provides a... View More

scope:

1.1 This practice describes the components of a direct current plasma (DCP) atomic emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This practice does, however, attempt to identify critical factors affecting bias, precision, and sensitivity. A prospective user should consult with the vendor before placing an order to design a testing protocol for demonstrating that the instrument meets all anticipated needs.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazards statements are give in Section 9.

Document History

May 1, 2017
Standard Practice for Describing and Specifying a Direct Current Plasma Atomic Emission Spectrometer
1.1 This practice describes the components of a direct current plasma (DCP) atomic emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This...
ASTM E1832-08(2012)
December 1, 2012
Standard Practice for Describing and Specifying a Direct Current Plasma Atomic Emission Spectrometer
1.1 This practice describes the components of a direct current plasma (DCP) atomic emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This...
May 1, 2008
Standard Practice for Describing and Specifying a Direct Current Plasma Atomic Emission Spectrometer
1.1 This practice describes the components of a direct current plasma (DCP) atomic emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This...
October 1, 2003
Standard Practice for Describing and Specifying a Direct Current Plasma Atomic Emission Spectrometer (Withdrawn 2004)
1.1 This practice describes the components of a direct current plasma (DCP) atomic emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This...
October 10, 1996
Standard Practice for Describing and Specifying a Direct-Current-Plasma Optical Emission Spectrometer
1.1 This practice describes the components of a direct-current-plasma (DCP) optical emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This...
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