ASTM International - ASTM F97-72(1997)e1
Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration
|Publication Date:||10 December 1997|
1.1 These practices cover procedures that will normally detect and locate the sites of gross leaks in electron devices.
1.2 These procedures are suitable for use on selected parts during receiving inspection or to verify and locate leakage sites for production control. They are not quantitative; no indication of leak size can be inferred from the test.
1.3 These procedures are most suitable for use on transparent glass-encased devices; all methods are applicable to transparent parts with an internal cavity. Method A, Penetrant-Capillary,
1.4 Because of the possibility of dye entrapment between the component and an attached part, components with mechanically attached parts, such as a radiator on a power transistor, should be tested before the attachment is made or after it has been removed.
Note 1-Alternative methods for determining hermeticity of electron devices may be found in Practices F98 (see 2.1) and Test Methods F134 (see 2.1).
1.5 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.
1.6 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statement, see Section 8.