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ASTM International - ASTM E1078-14

Standard Guide for Specimen Preparation and Mounting in Surface Analysis

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Organization: ASTM International
Publication Date: 1 October 2014
Status: inactive
Page Count: 10
ICS Code (Physicochemical methods of analysis): 71.040.50
significance And Use:

4.1 Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable... View More

scope:

1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS and ESCA), and

1.1.3 Secondary ion mass spectrometry (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

December 1, 2020
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: 1.1.1 Auger electron spectroscopy...
ASTM E1078-14
October 1, 2014
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
4.1 Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable...
May 1, 2009
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable data....
August 10, 2002
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable data....
September 10, 1997
Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis
1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis. 1.2 This guide applies to the following surface analysis disciplines: 1.2.1 Auger electron...
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