ASTM International - ASTM F867M-94A
Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
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| Organization: | ASTM International |
| Publication Date: | 1 January 1994 |
| Status: | inactive |
| Page Count: | 7 |
| ICS Code (Radiation measurements): | 17.240 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
ASTM F867M-94A
January 1, 1994
Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
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