5.1 Duplex grain size may occur in some metals and alloys as a result of their thermomechanical processing history. For comparison of mechanical properties with metallurgical features, or for specification purposes, it may be important to be able to characterize grain size in such materials. Assigning an average grain size value to a duplex grain size specimen does not adequately characterize the appearance of that specimen, and may even misrepresent its appearance. For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen.

5.2 These test methods may be applied to specimens or products containing randomly intermingled grains of two or more significantly different sizes (henceforth referred to as random duplex grain size). Examples of random duplex grain sizes include: isolated coarse grains in a matrix of much finer grains, extremely wide distributions of grain sizes, and bimodal distributions of grain size.

5.3 These test methods may also be applied to specimens or products containing grains of two or more significantly different sizes, but distributed in topologically varying patterns (henceforth referred to as topological duplex grain sizes). Examples of topological duplex grain sizes include: systematic variation of grain size across the section of a product, necklace structures, banded structures, and germinative grain growth in selected areas of critical strain.

5.4 These test methods may be applied to specimens or products regardless of their state of recrystallization.

5.5 Because these test methods describe deviations from a single, log-normal distribution of grain sizes, and characterize patterns of variation in grain size, the total specimen cross-section must be evaluated.

5.6 These test methods are limited to duplex grain sizes as identifiable within a single polished and etched metallurgical specimen. If duplex grain size is suspected in a product too large to be polished and etched as a single specimen, macroetching should be considered as a first step in evaluation. The entire macroetched cross-section should be used as a basis for estimating area fractions occupied by distinct grain sizes, if possible. If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well.

5.7 These test methods are intended to be applied to duplex grain sizes. Duplex grain structures (for example, multiphase alloys) are not necessarily duplex in grain size, and as such are not the subject of these methods. However, the test methods described here for area fraction estimation may be of use in describing duplex grain structures.