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ISO 24236

Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale

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Organization: ISO
Publication Date: 15 April 2005
Status: active
Page Count: 22
ICS Code (Chemical analysis): 71.040.40

Document History

ISO 24236
April 15, 2005
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
A description is not available for this item.

References

This document is referenced by:
ASTM E1016 - Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
Published by ASTM on June 1, 2007
The purpose of this guide is to familiarize the analyst with some of the relevant literature describing the physical properties of modern electrostatic electron spectrometers. This guide is intended...
This document is referenced by:
ISO 23830 - Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Published by ISO on November 15, 2008
This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general...
This document is referenced by:
ISO 15471 - Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
Published by ISO on September 1, 2016
This International Standard specifies the requirements for the description of specific aspects of the performance of an Auger electron spectrometer.
This document is referenced by:
ISO TR 10993-22 - Biological evaluation of medical devices - Part 22: Guidance on nanomaterials
Published by ISO on July 1, 2017
This document describes considerations for the biological evaluation of medical devices that are composed of or contain nanomaterials. In addition, this guidance can also be used for the evaluation...
This document is referenced by:
ISO 20903 - Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
Published by ISO on February 1, 2019
This document specifies the necessary information required in a report of analytical results based on measurements of the intensities of peaks in Auger electron and X-ray photoelectron spectra....
This document is referenced by:
BS ISO 20903 - TC - Tracked Changes (Redline) – Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
Published by BSI on February 24, 2020
A description is not available for this item.
This document is referenced by:
BS ISO 15471 - TC - Tracked Changes (Redline) – Surface chemical analysis — Auger electron spectroscopy — Description of selected instrumental performance parameters
Published by BSI on February 26, 2020
A description is not available for this item.
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