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ASTM E1161

STANDARD TEST METHOD FOR RADIOGRAPHIC TESTING OF SEMICONDUCTORS AND ELECTRONIC COMPONENTS

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Organization: ASTM
Publication Date: 27 March 1987
Status: inactive
Page Count: 4
ICS Code (Semiconductor devices in general): 31.080.01

Document History

June 1, 2009
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical...
June 1, 2009
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical...
June 10, 2003
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items....
December 10, 1995
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
1. Scope 1.1 This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of...
September 15, 1992
STANDARD TEST METHOD FOR RADIOLOGIC TESTING OF SEMICONDUCTORS AND ELECTRONIC COMPONENTS
A description is not available for this item.
ASTM E1161
March 27, 1987
STANDARD TEST METHOD FOR RADIOGRAPHIC TESTING OF SEMICONDUCTORS AND ELECTRONIC COMPONENTS
A description is not available for this item.

References

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