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ASTM - F1192

STANDARD GUIDE FOR THE MEASUREMENT OF SINGLE EVENT PHENOMENA (SEP) INDUCED BY HEAVY ION IRRADIATION OF SEMICONDUCTOR DEVICES

inactive
Organization: ASTM
Publication Date: 1 January 1990
Status: inactive
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

October 1, 2011
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
October 1, 2011
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
June 10, 2000
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
1. Scope 1.1 This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy...
June 10, 2000
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
F1192
January 1, 1990
STANDARD GUIDE FOR THE MEASUREMENT OF SINGLE EVENT PHENOMENA (SEP) INDUCED BY HEAVY ION IRRADIATION OF SEMICONDUCTOR DEVICES
A description is not available for this item.
October 31, 1988
STANDARD GUIDE FOR THE MEASUREMENT OF SINGLE EVENT PHENOMENA FROM HEAVY ION IRRADIATION OF SEMICONDUCTOR DEVICES
A description is not available for this item.

References

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