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ASTM F26

STANDARD TEST METHODS FOR DETERMINING THE ORIENTATION OF A SEMICONDUCTIVE SINGLE CRYSTAL

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Organization: ASTM
Publication Date: 29 May 1987
Status: inactive
Page Count: 6
ICS Code (Semiconducting materials): 29.045

Document History

August 28, 1987
Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal
1. Scope 1.1 These test methods cover techniques for determining the crystallographic orientation of a surface which is roughly parallel to a low-index atomic plane in single crystals used primarily...
ASTM F26
May 29, 1987
STANDARD TEST METHODS FOR DETERMINING THE ORIENTATION OF A SEMICONDUCTIVE SINGLE CRYSTAL
A description is not available for this item.
May 25, 1984
STANDARD METHODS FOR DETERMINING THE ORIENTATION OF A SEMICONDUCTIVE SINGLE CRYSTAL
A description is not available for this item.
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