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IEC 60759

Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

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Organization: IEC
Publication Date: 1 January 1983
Status: active
Page Count: 108
ICS Code (Radiation measurements): 17.240
scope:

This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this standard. Clause 5 is essentially tutorial.

Document History

IEC 60759
January 1, 1983
Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics...

References

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