Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
|Publication Date:||1 January 1983|
|ICS Code (Radiation measurements):||17.240|
This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this standard. Clause 5 is essentially tutorial.