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ASTM F1190

STANDARD PRACTICE FOR NEUTRON IRRADIATION OF UNBIASED ELECTRONIC COMPONENTS

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Organization: ASTM
Publication Date: 31 October 1988
Status: inactive
Page Count: 4
ICS Code (Electronic components in general): 31.020
ICS Code (Semiconductor devices in general): 31.080.01

Document History

March 1, 2018
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation to...
October 1, 2011
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation from...
January 10, 1999
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1. Scope 1.1 This guide strictly applies only to the exposure of unbiased silicon (SI) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron...
January 10, 1999
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
This guide strictly applies only to the exposure of unbiased silicon (SI) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation from...
January 1, 1993
Standard Practice for Neutron Irradiation of Unbiased Electronic Components
A description is not available for this item.
ASTM F1190
October 31, 1988
STANDARD PRACTICE FOR NEUTRON IRRADIATION OF UNBIASED ELECTRONIC COMPONENTS
A description is not available for this item.

References

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