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ASTM F1263

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

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Organization: ASTM
Publication Date: 10 December 1999
Status: inactive
Page Count: 3
ICS Code (Electronic components in general): 31.020
scope:

1. Scope

1.1 This guide covers the use of over testing in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Over testing is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how over testing may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.

Document History

June 1, 2011
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of...
ASTM F1263
December 10, 1999
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1. Scope 1.1 This guide covers the use of over testing in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Over testing is testing a...
December 10, 1999
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of...
January 1, 1994
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
A description is not available for this item.
October 27, 1989
STANDARD GUIDE FOR ANALYSIS OF OVERTEST DATA IN RADIATION TESTING OF ELECTRONIC PARTS (R 1994)(E1-1994)
A description is not available for this item.

References

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