Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
|Publication Date:||10 December 1999|
|ICS Code (Electronic components in general):||31.020|
1.1 This guide covers the use of over testing in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Over testing is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how over testing may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.