IPC - TM-650 2.2.2
Conductor Width and Spacing; Revision A - May 1986
inactive
| Organization: | IPC |
| Publication Date: | 1 January 1986 |
| Status: | inactive |
| Page Count: | 1 |
Document History
August 1, 1997
Optical Dimensional Verification
This method is intended to describe optically enhanced measurement techniques for dimensions of 3 mm or less, typically referenced on a Printed Board drawing. This method will not cover mechanical...
TM-650 2.2.2
January 1, 1986
Conductor Width and Spacing; Revision A - May 1986
A description is not available for this item.