JEDEC JESD 33
Standard Method for Measuring and Using the Temperature Coefficient of Resistance to Determine the Temperature of a Metallization Line
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| Organization: | JEDEC |
| Publication Date: | 1 January 1995 |
| Status: | inactive |
| Page Count: | 29 |
Document History
February 1, 2004
Standard Method for Measuring and Using the Temperature Coefficient of Resistance to Determine the Temperature of a Metallization Line
This newly revised test method provides a procedure for measuring the temperature coefficient of resistance, TCR(T), of thin-film metallizations used in microelectronic circuits and devices....
JEDEC JESD 33
January 1, 1995
Standard Method for Measuring and Using the Temperature Coefficient of Resistance to Determine the Temperature of a Metallization Line
A description is not available for this item.