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DLA - SMD-5962-87668

MICROCIRCUITS, 32-BIT MICROPROCESSOR DIGITAL, CHMOS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 14 August 1987
Status: inactive
Page Count: 17

Document History

SMD-5962-87668 REV C
September 24, 1991
MICROCIRCUITS, 32-BIT MICROPROCESSOR DIGITAL, CHMOS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
SMD-5962-87668 REV B
September 14, 1989
MICROCIRCUITS, 32-BIT MICROPROCESSOR DIGITAL, CHMOS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-87668 REV A
September 29, 1988
MICROCIRCUITS, 32-BIT MICROPROCESSOR DIGITAL, CHMOS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-87668
August 14, 1987
MICROCIRCUITS, 32-BIT MICROPROCESSOR DIGITAL, CHMOS, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
MIL-BUL-103AC CANC NOTICE 1 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by DLA on December 22, 1995
A description is not available for this item.
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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