UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

NPFC - MIL-M-38510/607

MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON

active, Most Current
Buy Now
Organization: NPFC
Publication Date: 16 August 1993
Status: active
Page Count: 1

Document History

MIL-M-38510/607
March 16, 2016
Microcircuits, Digital CMOS Semicustom (Gate Array) Devices, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/607
July 23, 2002
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/607
August 9, 1996
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/607A (2)
March 23, 1995
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/607
August 16, 1993
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/607
January 29, 1992
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, complimentary oxide insulated silicon gate semiconductor, semicustom (gate array) devices. Two product assurance classes (B...
MIL-M-38510/607 (1)
November 9, 1989
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/607
July 6, 1988
MICROCIRCUITS, DIGITAL, CMOS, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
A description is not available for this item.
View Less
View All

References

This document references:
JEDEC JESD 12-3 - CMOS Gate Array Macrocell Standard
Published by JEDEC on January 1, 1986
This standard defines a minimum set of macro cell standards for CMOS gate arrays. A total of 41 macro cell types are addressed, all of which are commonly used by gate array designers to implement...
This document references:
JEDEC JESD 12 - Standard for Gate Array Benchmark Set
Published by JEDEC on January 1, 1985
The purpose of these benchmarks is to provide a common set of high level functions which serve as vehicles for comparing the performance of gate arrays implemented in any technology using any...
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
This document references:
ASME Y14.5 - Dimensioning and Tolerancing
Published by ASME on January 1, 2018
INTRODUCTION This Standard establishes symbols, rules, definitions, requirements, defaults, and recommended practices for stating and interpreting dimensioning, tolerancing, and related requirements...
View Less
View All
Advertisement