CENELEC - EN 60749-17
Semiconductor devices Mechanical and climatic test methods Part 17: Neutron irradiation
inactive
| Organization: | CENELEC |
| Publication Date: | 1 April 2003 |
| Status: | inactive |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
May 1, 2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to...
EN 60749-17
April 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 17: Neutron irradiation
A description is not available for this item.