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ASTM E1635

Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

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Organization: ASTM
Publication Date: 1 November 2006
Status: inactive
Page Count: 2
ICS Code (Physicochemical methods of analysis): 71.040.50
scope:

This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by secondary ion mass spectrometry (SIMS).

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

November 1, 2006
Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by secondary ion mass...
ASTM E1635
November 1, 2006
Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by secondary ion mass...
November 1, 2006
Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by secondary ion mass...
September 10, 1995
Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
1. Scope 1.1 This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by...
September 15, 1994
STANDARD PRACTICE FOR REPORTING IMAGING DATA IN SECONDARY ION MASS SPECTROMETRY (SIMS)
A description is not available for this item.

References

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