AFNOR - NF EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14 : robustness of terminations (lead integrity)
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 January 2004 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-14
January 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 14 : robustness of terminations (lead integrity)
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