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NPFC - MIL-PRF-19500/122

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358

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Organization: NPFC
Publication Date: 7 June 1999
Status: inactive
Page Count: 1

Document History

MIL-S-19500/122
May 16, 2017
Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N1358
A description is not available for this item.
MIL-S-19500/122
July 6, 2011
Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N1358
A description is not available for this item.
MIL-S-19500/122
March 26, 2004
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
A description is not available for this item.
MIL-PRF-19500/122
June 7, 1999
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
A description is not available for this item.
MIL-S-19500/122
August 25, 1988
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
A description is not available for this item.
MIL-S-19500/122
March 21, 1972
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
A description is not available for this item.
MIL-S-19500/122
January 31, 1967
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
This specification covers the detail requirements for a high-power, PNP, germanium transistor. See figure 1 (TO-36).
MIL-S-19500/122B
July 28, 1965
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
A description is not available for this item.
MIL-S-19500/122
March 19, 1962
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N1358
A description is not available for this item.
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References

This document references:
MIL-PRF-19500R - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
Published by DLA on July 24, 2021
Scope. This specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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