DLA - SMD-5962-95549 REV A
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 1 March 2001 |
| Status: | inactive |
| Page Count: | 12 |
scope:
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
October 14, 2021
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON
Scope.
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment...
December 12, 2013
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
February 22, 2006
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
SMD-5962-95549 REV A
March 1, 2001
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
December 27, 1994
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...