DLA - SMD-5962-91553
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 30 January 1991 |
| Status: | inactive |
| Page Count: | 20 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 Specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function 01 54BCT652 Octal bus transceivers and registers with three-state outputs
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535
For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.
Outline letter Case outline K F.6 (24-lead, .640" × .420" × .090"), flat package L D-9 (24-lead, 1.280" × .310" × .200"), dual-in-line package 3 C-4 (28-terminal, .460" × .460" × .100"), square chip carrier package
The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Supply voltage range VCC - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC input voltage (I/0 ports) - - - - - - - - - - - −0.5 V dc to +5.5 V dc DC input voltage (Excluding I/0 ports) - - - - - - −0.5 V dc to +7.0 V dc Voltage applied to a disabled 3-state output - - - −0.5 V dc to +5.5 V dc Voltage applied to any output in the high state - −0.5 V dc to VCC Current into any output in the low state - - - - - 96 mA Storage temperature range - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - +300°C Thermal resistance, junction-to-case (θJC) - - - - See MIL-M-38510, appendix C Junction temperature (TJ) - - - - - - - - - - - - +175°C Input clamp current - - - - - - - - - - - - - - - −30mA Power dissipation (PD) - - - - - - - - - - - - - - 591 mA 2/
Supply voltage range (VCC) - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Minimum high-level input voltage (VIH) - - - - - - 2.0 V dc Maximum low-level input voltage (VIL) - - - - - - 0.8 V dc Maximum high-level output current (IOH) - - - - - −12 mA Maximum low-level output current (IOL) - - - - - - −48 mA Case operating temperature range (TC) - - - - - - −55°C to +125°C Pulse duration (tw), CBA or CAB high - - - - - - - 7.0 ns CBA or CAB low - - - - - - - - - - - - - - - - - 7.0 ns Setup time(ts), A or B before CAB or CBA going high TC = 25°C, VCC = 5.0 V - - - - - - - - - - - - - 5.0 ns TC = −55°C to 125°C, VCC = 4.5 V to 5.5 V - - - 6.0 ns Hold time (th), A or B after CAB or CBA going high 1.0 ns
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - XX percent 3/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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