UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

TIA/EIA-455-126

FOTP-126 Specitral Characterization of LEDs

inactive
Buy Now
Organization: TIA
Publication Date: 1 February 2000
Status: inactive
Page Count: 26

Document History

November 1, 2007
Spectral Characterization of LEDs
Introduction Intent The intent of this test procedure is to measure the central wavelength, peak wavelength, and the spectral width (RMS and FWHM) of a semiconductor light-emitting diode (LED)...
TIA/EIA-455-126
February 1, 2000
FOTP-126 Specitral Characterization of LEDs
A description is not available for this item.
Advertisement