UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-91695

MICROCIRCUIT, MEMORY, DIGITAL, CMOS PROGRAMMABLE LOGIC ARRAY (600 GATES), MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 15 January 1992
Status: inactive
Page Count: 26
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, .and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function Access time 01 610 EE CMOS 600-gate programmable 20 ns array logic

This device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

Device classes M, B, and S case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall met the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline L D-9 (24-lead, 1.280" × 0.310") dual-in-line package 3 C-4 (28-terminal, 0.460" × 0.460" × .100") square chip carrier

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (VCC) - - - - - - - - - - - - −0.5 V dc to 7.0 V dc Programming supply voltage (VPP) - - - - - - - - - −0.5 V dc to +9.50 V dc DC input voltage (VI)- - - - - - - - - - - - - - - −0.5 V dc to VCC +0.5 V dc Power dissipation (PD)- - - - - - - - - - - - - - - 630 mW Storage temperature range - - - - - - - - - - - - - −65°C to +150°C Junction temperature (TJ) 3/- - - - - - - - - - - - +200°C Thermal resistance, junction-to-case (ΘJC): Case L- - - - - - - - - - - - - - - - - - - - - - See MIL-M-38510, appendix C Case 3- - - - - - - - - - - - - - - - - - - - - - See MIL-M-38510, appendix C DC supply current (ICC or ISS)- - - - - - - - - - - +100 mA DC output current (IO) per pin- - - - - - - - - - - +25 mA Endurance - - - - - - - - - - - - - - - - - - - - - 100 cycles (minimum) Data retention - - - - - - - - - - - - - - - - - - 20 years minimum

Supply voltage (VCC)- - - - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Maximum low-level input voltage (VIL) - - - - - - - - −0.5 V dc to +0.8 V dc Minimum high-level input voltage (VIH)- - - - - - - - +2.0 V dc to VCC +0.5 V dc Case operating temperature range (TC) - - - - - - - - −55°C to +125°C Input rise time (TR)- - - - - - - - - - - - - - - - - 50 ns maximum Input fall time (TF)- - - - - - - - - - - - - - - - - 50 ns maximum Clock pins, rise time - - - - - - - - - - - - - - - - 10 ns maximum Clock pins, fall time - - - - - - - - - - - - - - - - 10 ns maximum

Fault coverage measurement of manufacturing Logic tests (MIL-STD-883, test method 5012)- - - - 4/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

November 17, 2017
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY (600 GATES), MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
August 23, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY (600 GATES), MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-91695
January 15, 1992
MICROCIRCUIT, MEMORY, DIGITAL, CMOS PROGRAMMABLE LOGIC ARRAY (600 GATES), MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

Advertisement