ECIA - EIA/ECA-364-110
TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets
inactive
| Organization: | ECIA |
| Publication Date: | 1 August 2006 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate.
NOTE - If the ramp time between temperature extremes is ≤ 2.0 minutes, this test procedure shall not be used. The procedure as specified in EIA-364-32 (Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets) shall be performed as a substitute.
Document History
August 1, 2006
TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets
This standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate.
NOTE ⎯ If the ramp time between...
EIA/ECA-364-110
August 1, 2006
TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets
This standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate.
NOTE — If the ramp time between...
August 1, 2006
TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets
This standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate.
NOTE — If the ramp time between...