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IEC/PAS 62178

Temperature Cycling

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Organization: IEC
Publication Date: 1 August 2000
Status: inactive
Page Count: 12

Document History

IEC/PAS 62178
August 1, 2000
Temperature Cycling
A description is not available for this item.

References

This document is replaced by:
IEC 60749-25 - Semiconductor devices Mechanical and climatic test methods Part 25: Temperature cycling
Published by IEC on July 1, 2003
This part of IEC 60749 provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating...
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