UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DS/EN 100012

Basic Specification: X-ray inspection of electronic components

inactive, Most Current
Organization: DS
Publication Date: 6 September 1995
Status: inactive
ICS Code (Electronic components in general): 31.020
scope:

This specification describes the equipment and procedures to be used for the inspection of electronic components by means of radiography and radioscopy. When the X-ray inspection is prescribed in a detail or component specification, specific accept/reject criteria should be prescribed either directly or by reference to an appropriate higher order specification (e.g. generic or Technology Approval Schedule - TAS).

Document History

DS/EN 100012
September 6, 1995
Basic Specification: X-ray inspection of electronic components
This specification describes the equipment and procedures to be used for the inspection of electronic components by means of radiography and radioscopy. When the X-ray inspection is prescribed in a...
Advertisement