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BSI - BS EN 120002

Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Infrared emitting diodes, infrared emitting diode arrays

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Organization: BSI
Publication Date: 15 June 1988
Status: active
Page Count: 22
ICS Code (Optoelectronics. Laser equipment): 31.260

Document History

BS EN 120002
June 15, 1988
Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Infrared emitting diodes, infrared emitting diode arrays
A description is not available for this item.

References

This document references:
BS CECC 20000 - Harmonized system of quality assessment for electronic components: Generic specification: Semiconductor optoelectronic and liquid crystal devices
Published by BSI on June 30, 1983
Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.
This document references:
BS 9000-2 - General Requirements for a System for Electronic Components of Assessed Quality Part 2: Specification for the National Implementation of the CECC System
Published by BSI on May 15, 1996
A description is not available for this item.

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