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# ASTM E2444

## Terminology Relating to Measurements Taken on Thin, Reflecting Films

inactive
 Organization: ASTM Publication Date: 1 May 2005 Status: inactive Page Count: 3 ICS Code (Mechanical structures for electronic equipment): 31.240 ICS Code (Electronics (Vocabularies)): 01.040.31
##### scope:

This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

The terms are listed in alphabetical order.

### Document History

October 15, 2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
October 15, 2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
October 15, 2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
ASTM E2444
May 1, 2005
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
May 1, 2005
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...