Terminology Relating to Measurements Taken on Thin, Reflecting Films
|Publication Date:||1 May 2005|
|ICS Code (Mechanical structures for electronic equipment):||31.240|
|ICS Code (Electronics (Vocabularies)):||01.040.31|
This standard consists of terms and definitions pertaining to
measurements taken on thin,
reflecting films, such as found in microelectromechanic
The terms are listed in alphabetical order.