DIN 50451-1
Pruefung von Materialien fuer die Halbleitertechnologie - Bestimmung von Elementspuren in Fluessigkeiten - Teil 1: Silber (Ag), Gold (Au), Calcium (Ca), Kupfer (Cu), Eisen (Fe), Kalium (K) und Natrium (Na) in Salpetersaeure mittels AAS
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 2003 |
| Status: | inactive |
| Page Count: | 8 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50451-1
April 1, 2003
Pruefung von Materialien fuer die Halbleitertechnologie - Bestimmung von Elementspuren in Fluessigkeiten - Teil 1: Silber (Ag), Gold (Au), Calcium (Ca), Kupfer (Cu), Eisen (Fe), Kalium (K) und Natrium (Na) in Salpetersaeure mittels AAS
A description is not available for this item.
January 1, 2002
Testing of materials for semiconductor technology - Determination of traces of metals in liquids - Part 1: Silver (Ag), Gold (Au), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
A description is not available for this item.
October 1, 1987
Testing of materials for semiconductor technology; determination of traces of metals in liquids; Ag, Au and Cu in nitric acid by means of AAS
A description is not available for this item.