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IEC 60749-16

Semiconductor Devices - Mechanical and Climatic Test Methods - Part 16: Particle Impact Noise Detection (PIND)

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Organization: IEC
Publication Date: 1 January 2003
Status: active
Page Count: 22
ICS Code (Semiconductor devices in general): 31.080.01

Document History

IEC 60749-16
January 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 16: Particle Impact Noise Detection (PIND)
A description is not available for this item.

References

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