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DIN EN 60749-11

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002

active, Most Current
Organization: DIN
Publication Date: 1 April 2003
Status: active
Page Count: 10
ICS Code (Semiconductor devices in general): 31.080.01

Document History

DIN EN 60749-11
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002
A description is not available for this item.

References

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