DIN EN 60749-11
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002
active, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 2003 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-11
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002
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