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IEC CISPR/TR 16-4-3

Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in the determination of EMC compliance of mass-produced products

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Organization: IEC
Publication Date: 1 November 2003
Status: inactive
Page Count: 32
ICS Code (Immunity): 33.100.20
ICS Code (Emission): 33.100.10

Document History

January 1, 2007
Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in the determination of EMC compliance of mass-produced products
This part of CISPR 16 deals with statistical considerations in the determination of EMC compliance of mass-produced products. The reasons for such statistical considerations are: a) that the...
October 1, 2006
Amendment 1 Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in the determination of EMC compliance of mass-produced products
A description is not available for this item.
May 1, 2004
Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in the determination of EMC compliance of mass-produced products
This part of CISPR 16 deals with statistical considerations in the determination of EMC compliance of mass-produced products. The reasons for such statistical considerations are: a) that the...
May 1, 2004
Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in the determination of EMC compliance of mass-produced products
This part of CISPR 16 deals with statistical considerations in the determination of EMC compliance of mass-produced products. The reasons for such statistical considerations are: a) that the...
IEC CISPR/TR 16-4-3
November 1, 2003
Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in the determination of EMC compliance of mass-produced products
A description is not available for this item.
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