CENELEC - EN 61000-4-20
Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides
inactive
| Organization: | CENELEC |
| Publication Date: | 1 April 2003 |
| Status: | inactive |
| Page Count: | 70 |
| ICS Code (Immunity): | 33.100.20 |
| ICS Code (Emission): | 33.100.10 |
Document History
April 1, 2022
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
This part of IEC 61000 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include...
November 1, 2010
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Scope and object
This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides....
EN 61000-4-20
April 1, 2003
Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides
A description is not available for this item.
April 1, 2003
Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides
A description is not available for this item.