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IEC 60749-13

Semiconductor Devices - Mechanical and Climatic Test Methods - Part 13: Salt Atmosphere

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Organization: IEC
Publication Date: 1 April 2002
Status: inactive
Page Count: 18
ICS Code (Semiconductor devices in general): 31.080.01

Document History

February 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
August 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 13: Salt Atmosphere CORRIGENDUM 1
A description is not available for this item.
IEC 60749-13
April 1, 2002
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 13: Salt Atmosphere
A description is not available for this item.

References

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