AFNOR - NF EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND)
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 July 2003 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-16
July 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND)
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