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AFNOR - NF EN 60749-16

Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND)

active, Most Current
Organization: AFNOR
Publication Date: 1 July 2003
Status: active
ICS Code (Semiconductor devices in general): 31.080.01

Document History

NF EN 60749-16
July 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND)
A description is not available for this item.
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