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DIN 50450-1

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell

active, Most Current
Organization: DIN
Publication Date: 1 August 1987
Status: active
Page Count: 2
ICS Code (Semiconducting materials): 29.045
ICS Code (Gases for industrial application): 71.100.20

Document History

DIN 50450-1
August 1, 1987
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell
A description is not available for this item.
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