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NPFC - MIL-S-19500/77

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393

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Organization: NPFC
Publication Date: 5 July 1961
Status: inactive
Page Count: 10

Document History

MIL-S-19500/77C VALID NOTICE 5
June 7, 2021
Semiconductor Device, Transistor, PNP, Germanium, Low-Power Type 2N393
A description is not available for this item.
MIL-S-19500/77
July 13, 2011
Semiconductor Device, Transistor, PNP, Germanium, Low-Power Type 2N393
A description is not available for this item.
MIL-S-19500/77
March 24, 2004
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-PRF-19500/77
June 7, 1999
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-S-19500/77
July 6, 1990
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-S-19500/77
May 2, 1985
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-S-19500/77
March 22, 1982
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-S-19500/77
April 26, 1977
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-S-19500/77
February 7, 1969
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
MIL-S-19500/77
March 6, 1968
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
This specification covers the detail requirements for a low-power, PNP, germanium, transistor. See figure 1.
MIL-S-19500/77
July 5, 1961
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393
A description is not available for this item.
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References

This document references:
MIL-PRF-19500R - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
Published by DLA on July 24, 2021
Scope. This specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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