DIN EN 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
active, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 2003 |
| Status: | active |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-2
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
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