CENELEC - EN 60749-29
Semiconductor devices Mechanical and climatic test methods Part 29: Latch-up test
inactive
| Organization: | CENELEC |
| Publication Date: | 1 December 2003 |
| Status: | inactive |
| Page Count: | 24 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
August 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Scope and object
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.
This test is classified as destructive.
The purpose of this test is to...
EN 60749-29
December 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 29: Latch-up test
A description is not available for this item.