Standard Practice for X-Ray Diffraction Determination of Phase Content of Plasma-Sprayed Hydroxyapatite Coatings
|Publication Date:||10 May 2000|
|ICS Code (Other treatments and coatings):||25.220.99|
1.1 This practice is for the determination, by the Reference Intensity Ratio External Standard Method, of the percent by weight of the crystalline phases, hydroxyapatite (HA), beta- (whitlockite) tricalcium phosphate (β- TCP), and calcium oxide (CaO) in coatings deposited upon metallic substrates by plasma-spraying hydroxyapatite.
1.2 A major component in plasma-sprayed HA coatings other than HA is expected to be amorphous calcium phosphate (ACP). Crystalline components other than HA that may be present include alpha- and beta- (whitlockite) tricalcium phosphates, tetracalcium phosphate (TTCP), calcium oxide, and calcium pyrophosphates. Quantification of the minor crystalline components has proven to be very unreliable due to extreme overlap and confounding of X-ray diffraction peaks. Therefore, this practice addresses the quantification of only HA, β-TCP, and CaO.
1.3 This practice was developed for plasma-sprayed HA coatings with HA contents of at least 50 % of the total coating. It is recognized that the analysis of the crystalline components uses diffraction from regions of the pattern that also includes a small contribution from the amorphous component. However, within the limits of applicability of this practice, the effect of such interference is believed to be negligible.
1.4 The coating analyzed shall be produced and processed under equivalent manufacturing conditions to that on the device of interest.
1.5 This practice requires the use of monochromated copper Ka radiation and flat samples.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.