DS/EN 60749-10
Semiconductor devices – Mechanical and climatic test methods – Part 10: Mechanical shock
active, Most Current
Buy Now
| Organization: | DS |
| Publication Date: | 23 December 2003 |
| Status: | active |
| Page Count: | 3 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating normally applicable to cavity-type packages. In general, this mechanical shock test is in conformity with IEC 60068-2-27 but, due to specific requirements of semiconductors, the clauses of this standard apply.
Document History
DS/EN 60749-10
December 23, 2003
Semiconductor devices – Mechanical and climatic test methods – Part 10: Mechanical shock
This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result...
August 30, 2002
Semiconductor devices – Mechanical and climatic test methods – Part 10: Mechanical shock
This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result...
References
Related Products
Searching for related products...