AFNOR - NF EN 60749-4
Semiconductor devices - Mechanical and climatic test methods - Part 4 : damp heat, steady state, highly accelerated stress test (HAST)
inactive
| Organization: | AFNOR |
| Publication Date: | 1 December 2002 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
June 16, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)
A description is not available for this item.
NF EN 60749-4
December 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 4 : damp heat, steady state, highly accelerated stress test (HAST)
A description is not available for this item.
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