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DLA - MIL-R-39016/37

RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION

inactive
Organization: DLA
Publication Date: 16 January 1975
Status: inactive
Page Count: 6

Document History

MIL-PRF-39016/37E
January 8, 2024
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-PRF-39016/37
March 6, 2019
Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 2 Amperes (0.150-Inch Terminal Spacing), with Internal Diode for Coil Transient Suppression
A description is not available for this item.
MIL-PRF-39016/37
June 2, 2014
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-PRF-39016/37
March 29, 2010
Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 2 Amperes (0.150-Inch Terminal Spacing), with Internal Diode for Coil Transient Suppression
A description is not available for this item.
MIL-PRF-39016/37
August 5, 2003
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-PRF-39016/37B (2)
June 28, 1996
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-R-39016/37
July 10, 1992
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-R-39016/37
July 20, 1988
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the relays described herein shall consist of this specification...
MIL-R-39016/37
August 13, 1985
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-R-39016/37
August 5, 1983
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-R-39016/37
June 23, 1981
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
MIL-R-39016/37
January 16, 1975
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2 AMPERES (0.150-INCH TERMINAL SPACING), WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION
A description is not available for this item.
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References

This document references:
MIL-PRF-39016/38 - Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 2 Amperes (0.150-Inch Terminal Spacing), with Internal Diodes for Coil Transient Suppression and Reverse Polarity Protection
Published by NPFC on March 29, 2010
A description is not available for this item.
This document references:
MIL-PRF-39016 - RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Published by NPFC on September 13, 2017
A description is not available for this item.
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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