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ASTM F448

Standard Test Method for Measuring Steady-State Primary Photocurrent

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Organization: ASTM
Publication Date: 10 January 1999
Status: inactive
Page Count: 7
ICS Code (Optoelectronics. Laser equipment): 31.260
scope:

1. Scope

1.1 This test method covers the measurement of steady-state primary photocurrent, 1pp, generated in semiconductor devices when these devices are exposed to ionizing radiation. These procedures are intended for the measurement of photocurrents greater than 10−9 A·s/Gy(Si or Ge), in cases for which the relaxation time of the device being measured is less than 25 % of the pulse width of the ionizing source. The validity of these procedures for ionizing dose rates as great as 10 8Gy(Si or Ge)/s has been established. The procedures may be used for measurements at dose rates as great as 10 10Gy(Si or Ge)/s; however, extra care must be taken. Above 10 8Gy/s the package response may dominate the device response for technologies such as complementary metal-oxide semiconductor, (CMOS)/silicon-on sapphire (SOS). Additional precautions are also required when measuring photocurrents of 10−9 A·s/Gy(Si or Ge) or lower.

1.2 Setup, calibration, and test circuit evaluation procedures are also included in this test method.

1.3 Because of the variability between device types and in the requirements of different applications, the dose rate range over which any specific test is to be conducted is not given in this test method but must be specified separately.

1.4 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

March 1, 2018
Standard Test Method for Measuring Steady-State Primary Photocurrent
This test method covers the measurement of steady-state primary photocurrent, Ipp, generated in semiconductor devices when these devices are exposed to ionizing radiation. These procedures are...
June 1, 2011
Standard Test Method for Measuring Steady-State Primary Photocurrent
This test method covers the measurement of steady-state primary photocurrent, Ipp, generated in semiconductor devices when these devices are exposed to ionizing radiation. These procedures are...
ASTM F448
January 10, 1999
Standard Test Method for Measuring Steady-State Primary Photocurrent
1. Scope 1.1 This test method covers the measurement of steady-state primary photocurrent, 1pp, generated in semiconductor devices when these devices are exposed to ionizing radiation. These...
January 10, 1999
Standard Test Method for Measuring Steady-State Primary Photocurrent
This test method covers the measurement of steady-state primary photocurrent, Ipp, generated in semiconductor devices when these devices are exposed to ionizing radiation. These procedures are...
February 24, 1989
STANDARD TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT
A description is not available for this item.
April 25, 1980
STANDARD METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT (R 1984)
A description is not available for this item.

References

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