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IEEE 1149.4

Standard for a Mixed Signal Test Bus

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Organization: IEEE
Publication Date: 26 June 1999
Status: inactive
Page Count: 84
scope:

This standard defines test features to be included in a mixed-signal (analog and digital) component, together with associated test protocols, to provide standardized approaches to

- Interconnect test: Testing for opens and shorts among the interconnections in a PCA;

- Parametric test: Making analog characterization measurements, and testing for presence and value of discrete components in a PCA; and

- Internal test: Testing the internal circuitry of the mixed-signal component itself regardless of whether it is part of a PCA.

The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration.

Document History

December 9, 2010
A Mixed-Signal Test Bus
This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital...
IEEE 1149.4
June 26, 1999
Standard for a Mixed Signal Test Bus
This standard defines test features to be included in a mixed-signal (analog and digital) component, together with associated test protocols, to provide standardized approaches to — Interconnect...

References

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