IEEE 1149.4
Standard for a Mixed Signal Test Bus
| Organization: | IEEE |
| Publication Date: | 26 June 1999 |
| Status: | inactive |
| Page Count: | 84 |
scope:
This standard defines test features to be included in a mixed-signal (analog and digital) component, together with associated test protocols, to provide standardized approaches to
- Interconnect test: Testing for opens and shorts among the interconnections in a PCA;
- Parametric test: Making analog characterization measurements, and testing for presence and value of discrete components in a PCA; and
- Internal test: Testing the internal circuitry of the mixed-signal component itself regardless of whether it is part of a PCA.
The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration.
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