scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein. Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the complete Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RNA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices s a meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V devices shall meet or exceed the electrical performance characteristics specified in table I herein after exposure to the specified irradiation levels specified in the absolute maximum ratings herein and the RHA marked device shall be marked in accordance with MIL-I-38535. A dash (-) indicates a non RHA device.

The device type shall identify the circuit function as follows:

Device type Generic number Circuit function 01 54BCT534 Octal D-type edge-triggered flip-flops, with inverted three-state outputs, TTL compatible

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

For device classes M, B, and S, case outlines shall meet the requirements in appendix C of - 38510 and as listed below. For device classes Q and V, case outlines shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline R D-8 (20-lead, 1.060" × .310" × .200"), dual-in-line package S F-9 (20-lead, .540" × .300" × .100"), flat package 2 C-2 (20-terminal, .358" × .358" × .100"), square chip carrier package

The lead finish shall be specified in MIL-M-38510 for classes M, B, and S, or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finish A, B. and C are considered acceptable and interchangeable without preference.

Supply voltage range (V_CC) - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Input voltage range - - - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Voltage applied to any output in the disabled state - −0.5 V dc to +5.5 V dc Voltage applied to any output in the high state - - - −0.5 V dc to V_CC Input clamp current - - - - - - - - - - - - - - - - - −30 mA Current into any output in the low state - - - - - 96 mA Storage temperature range - - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds)- - - - - - - +300°C Thermal resistance junction-to-case (θ_JC) - - - - - - See MIL-M-38510, appendix C Junction temperature (T_J) - - - - - - - - - - - - - - +175°C Power dissipation (P_D) - - - - - - - - - - - - - - - 514 mW 3/

Supply voltage range (V_CC) - - - - - - - - - - - - - - +4.5 V dc minimum to +5.5 V dc maximum minimum high level input voltage (V_IH) - - - - - - - - 2.0 V dc Maximum low level input voltage (V_IL) - - - - - - - - 0.8 V dc Maximum high level output current (I_OH) - - - - - - - −12 mA Maximum low level output current (I_OL) - - - - - - - - +48 mA Minimum setup time, data before CLK rising (t_s): data high - - - - - - - - - - - - - - - - - - - - - 6.0 ns data low - - - - - - - - - - - - - - - - - - - - - - 9.5 ns Minimum hold time, data after CLK rising (t_h): data high - - - - - - - - - - - - - - - - - - - - - 0.0 ns data low - - - - - - - - - - - - - - - - - - - - 1.0 ns Minimum pulse duration, (t_w): CLK high - - - - - - - - - - - - - - - - - - - - - - 6.0 ns CLK low - - - - - - - - - - - - - - - - - - - - - - 7.0 ns Case operating temperature range (T_C) - - - - - - - - −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - XX percent 2/

intended Use: