IEC 60444-8
Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units
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| Organization: | IEC |
| Publication Date: | 1 July 2003 |
| Status: | inactive |
| Page Count: | 30 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
December 1, 2016
Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of...
IEC 60444-8
July 1, 2003
Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units
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